We use cookies to ensure that we give you the best experience on our website.
IEEE 300

IEEE 300

$107.00

IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

Published by Publication Date Number of Pages
IEEE 12/29/1988 35

Description

IEEE 300 – IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

Revision Standard – Inactive-Reserved.

Product Details

Published:
12/29/1988
ISBN(s):
0738106747, 9780738106748
Number of Pages:
35
File Size:
1 file , 460 KB
Product Code(s):
STDRES12286
Note:
This product is unavailable in Russia, Belarus